Vaibhav Tripathi, Boris Murmann. Mismatch Characterization of Small Metal Fringe Capacitors. IEEE Trans. on Circuits and Systems, 61-I(8):2236-2242, 2014. [doi]
@article{TripathiM14,
title = {Mismatch Characterization of Small Metal Fringe Capacitors},
author = {Vaibhav Tripathi and Boris Murmann},
year = {2014},
doi = {10.1109/TCSI.2014.2332264},
url = {http://dx.doi.org/10.1109/TCSI.2014.2332264},
researchr = {https://researchr.org/publication/TripathiM14},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {61-I},
number = {8},
pages = {2236-2242},
}