Michael Trummer, Christoph Munkelt, Joachim Denzler. Online Next-Best-View Planning for Accuracy Optimization Using an Extended E-Criterion. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 1642-1645, IEEE, 2010. [doi]
@inproceedings{TrummerMD10,
title = {Online Next-Best-View Planning for Accuracy Optimization Using an Extended E-Criterion},
author = {Michael Trummer and Christoph Munkelt and Joachim Denzler},
year = {2010},
doi = {10.1109/ICPR.2010.406},
url = {http://dx.doi.org/10.1109/ICPR.2010.406},
tags = {optimization, e-science},
researchr = {https://researchr.org/publication/TrummerMD10},
cites = {0},
citedby = {0},
pages = {1642-1645},
booktitle = {20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010},
publisher = {IEEE},
}