Auto-Annotated Deep Segmentation for Surface Defect Detection

Du-Ming Tsai, Shu-Kai S. Fan, Yi-Hsiang Chou. Auto-Annotated Deep Segmentation for Surface Defect Detection. IEEE T. Instrumentation and Measurement, 70:1-10, 2021. [doi]

Authors

Du-Ming Tsai

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Shu-Kai S. Fan

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Yi-Hsiang Chou

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