Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Du-Ming Tsai, Jie-Yu Luo. Mean Shift-Based Defect Detection in Multicrystalline Solar Wafer Surfaces. IEEE Trans. Industrial Informatics, 7(1):125-135, 2011. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Wavelet-based defect detection in solar wafer images with inhomogeneous textureWei-Chen Li, Du-Ming Tsai. PR, 45(2):742-756, 2012. [doi] Saw-Mark Defect Detection in Heterogeneous Solar Wafer Images using GAN-based Training Samples Generation and CNN ClassificationDu-Ming Tsai, Morris S. K. Fan, Yi-Quan Huang, Wei-Yao Chiu. visapp 2019: 234-240 [doi]
The following publications are possibly variants of this publication: