On the Completeness of Test Cases for Atomic Arithmetic Expressions - researchr publication authors

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T. H. Tse, X. Feng, T. Y. Chen. On the Completeness of Test Cases for Atomic Arithmetic Expressions. In 1st Asia-Pacific Conference on Quality Software (APAQS 2000), 30-31 October 2000, Hong Kong, China, Proceedings. pages 149-155, IEEE Computer Society, 2000. [doi]

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T. H. Tse

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