Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis

T. H. Tse, Yves Le Traon, Zhenyu Chen 0001. Guest Editorial: A Retrospective of Special Sections on Software Testing and Program Analysis. IEEE Transactions on Reliability, 70(2):443-445, 2021. [doi]

Authors

T. H. Tse

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Yves Le Traon

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Zhenyu Chen 0001

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