A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap - researchr publication authors

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Tsu-Wei Tseng, Jin-Fu Li, Da-Ming Chang. A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap. In Georges G. E. Gielen, editor, Proceedings of the Conference on Design, Automation and Test in Europe, DATE 2006, Munich, Germany, March 6-10, 2006. pages 53-58, European Design and Automation Association, Leuven, Belgium, 2006. [doi]

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