Image Inspection System for Defect Detection of Multilayer Ceramic Capacitors - researchr publication authors

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Chun-Chieh Tseng, Mao-Fu Lai, Por-Song Lee. Image Inspection System for Defect Detection of Multilayer Ceramic Capacitors. In Second International Conference on Intelligent Information Hiding and Multimedia Signal Processing (IIH-MSP 2006), Pasadena, California, USA, December 18-20, 2006, Proceedings. pages 659-662, IEEE Computer Society, 2006. [doi]

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