Dao Van Tu, S. Chaitusaney, Akihiko Yokoyama. Maximum allowable distributed generation considering fault ride through requirement and reach reduction of utility relay. In IEEE Asian Solid State Circuits Conference, A-SSCC 2012, Kobe, Japan, November 12-14, 2012. pages 127-134, IEEE, 2012. [doi]
@inproceedings{TuCY12,
title = {Maximum allowable distributed generation considering fault ride through requirement and reach reduction of utility relay},
author = {Dao Van Tu and S. Chaitusaney and Akihiko Yokoyama},
year = {2012},
doi = {10.1109/ASSCC.2012.6523251},
url = {http://dx.doi.org/10.1109/ASSCC.2012.6523251},
researchr = {https://researchr.org/publication/TuCY12},
cites = {0},
citedby = {0},
pages = {127-134},
booktitle = {IEEE Asian Solid State Circuits Conference, A-SSCC 2012, Kobe, Japan, November 12-14, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2770-1},
}