Huy Tu, Zhe Yu 0002, Tim Menzies. Better Data Labelling With EMBLEM (and how that Impacts Defect Prediction). IEEE Trans. Software Eng., 48(2):278-294, 2022. [doi]
@article{TuYM22,
title = {Better Data Labelling With EMBLEM (and how that Impacts Defect Prediction)},
author = {Huy Tu and Zhe Yu 0002 and Tim Menzies},
year = {2022},
doi = {10.1109/TSE.2020.2986415},
url = {https://doi.org/10.1109/TSE.2020.2986415},
researchr = {https://researchr.org/publication/TuYM22},
cites = {0},
citedby = {0},
journal = {IEEE Trans. Software Eng.},
volume = {48},
number = {2},
pages = {278-294},
}