Laser moiré interferometry for fatigue life prediction of lead-free solders

Krishna Tunga, Suresh K. Sitaraman. Laser moiré interferometry for fatigue life prediction of lead-free solders. Microelectronics Reliability, 50(12):2026-2036, 2010. [doi]

Authors

Krishna Tunga

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Suresh K. Sitaraman

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