The Bayesian logistic regression in pattern recognition problems under concept drift - researchr publication authors

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Pavel A. Turkov, Olga Krasotkina, Vadim Mottl. The Bayesian logistic regression in pattern recognition problems under concept drift. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 2976-2979, IEEE, 2012. [doi]

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