New test compression scheme based on low power BIST - researchr publication authors

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Jerzy Tyszer, Michal Filipek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski. New test compression scheme based on low power BIST. In 18th IEEE European Test Symposium, ETS 2013, Avignon, France, May 27-30, 2013. pages 1-6, IEEE Computer Society, 2013. [doi]

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