Raimund Ubar, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Lembit Jürimägi. Fast identification of true critical paths in sequential circuits. Microelectronics Reliability, 81:252-261, 2018. [doi]
@article{UbarKJRJ18,
title = {Fast identification of true critical paths in sequential circuits},
author = {Raimund Ubar and Sergei Kostin and Maksim Jenihhin and Jaan Raik and Lembit Jürimägi},
year = {2018},
doi = {10.1016/j.microrel.2017.11.027},
url = {https://doi.org/10.1016/j.microrel.2017.11.027},
researchr = {https://researchr.org/publication/UbarKJRJ18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {81},
pages = {252-261},
}