Raimund Ubar, Jaan Raik. Efficient Hierarchical Approach to Test Generation for Digital Systems. In 1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA. pages 189-196, IEEE Computer Society, 2000. [doi]
@inproceedings{UbarR00, title = {Efficient Hierarchical Approach to Test Generation for Digital Systems}, author = {Raimund Ubar and Jaan Raik}, year = {2000}, url = {http://csdl.computer.org/comp/proceedings/isqed/2000/0525/00/05250189abs.htm}, tags = {testing, systematic-approach}, researchr = {https://researchr.org/publication/UbarR00}, cites = {0}, citedby = {0}, pages = {189-196}, booktitle = {1st International Symposium on Quality of Electronic Design (ISQED 2000), 20-22 March 2000, San Jose, CA, USA}, publisher = {IEEE Computer Society}, isbn = {0-7695-0525-2}, }