Taiki Uemura, Masanori Hashimoto. Investigation of single event upset and total ionizing dose in FeRAM for medical electronic tag. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 1, IEEE, 2015. [doi]
@inproceedings{UemuraH15,
title = {Investigation of single event upset and total ionizing dose in FeRAM for medical electronic tag},
author = {Taiki Uemura and Masanori Hashimoto},
year = {2015},
doi = {10.1109/IRPS.2015.7112824},
url = {http://dx.doi.org/10.1109/IRPS.2015.7112824},
researchr = {https://researchr.org/publication/UemuraH15},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015},
publisher = {IEEE},
isbn = {978-1-4673-7362-3},
}