Story Pattern Analysis Based on Scene Order Information in Four-Scene Comics

Miki Ueno, Hitoshi Isahara. Story Pattern Analysis Based on Scene Order Information in Four-Scene Comics. In 2nd International Workshop on coMics Analysis, Processing, and Understanding, 14th IAPR International Conference on Document Analysis and Recognition, ICDAR 2017, Kyoto, Japan, November 9-15, 2017. pages 78-83, IEEE, 2017. [doi]

Authors

Miki Ueno

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Hitoshi Isahara

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