Yener Ülker, Bilge Günsel, Ali Taylan Cemgil. Annealed SMC Samplers for Dirichlet Process Mixture Models. In 20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010. pages 2808-2811, IEEE, 2010. [doi]
@inproceedings{UlkerGC10,
title = {Annealed SMC Samplers for Dirichlet Process Mixture Models},
author = {Yener Ülker and Bilge Günsel and Ali Taylan Cemgil},
year = {2010},
doi = {10.1109/ICPR.2010.688},
url = {http://dx.doi.org/10.1109/ICPR.2010.688},
tags = {modeling, process modeling},
researchr = {https://researchr.org/publication/UlkerGC10},
cites = {0},
citedby = {0},
pages = {2808-2811},
booktitle = {20th International Conference on Pattern Recognition, ICPR 2010, Istanbul, Turkey, 23-26 August 2010},
publisher = {IEEE},
}