Detection of Careless Mistakes during Programming Learning using a Simple Electroencephalograph

Katsuyuki Umezawa, Makoto Nakazawa, Manabu Kobayashi, Yutaka Ishii, Michiko Nakano, Shigeichi Hirasawa. Detection of Careless Mistakes during Programming Learning using a Simple Electroencephalograph. In 15th International Conference on Computer Science & Education, ICCSE 2020, Delft, The Netherlands, August 18-22, 2020. pages 72-77, IEEE, 2020. [doi]

Authors

Katsuyuki Umezawa

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Makoto Nakazawa

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Manabu Kobayashi

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Yutaka Ishii

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Michiko Nakano

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Shigeichi Hirasawa

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