Julián Urbano, Mónica Marrero, Diego Martín. On the measurement of test collection reliability. In Gareth J. F. Jones, Paraic Sheridan, Diane Kelly, Maarten de Rijke, Tetsuya Sakai, editors, The 36th International ACM SIGIR conference on research and development in Information Retrieval, SIGIR '13, Dublin, Ireland - July 28 - August 01, 2013. pages 393-402, ACM, 2013. [doi]
@inproceedings{UrbanoMM13,
title = {On the measurement of test collection reliability},
author = {Julián Urbano and Mónica Marrero and Diego Martín},
year = {2013},
doi = {10.1145/2484028.2484038},
url = {http://doi.acm.org/10.1145/2484028.2484038},
researchr = {https://researchr.org/publication/UrbanoMM13},
cites = {0},
citedby = {0},
pages = {393-402},
booktitle = {The 36th International ACM SIGIR conference on research and development in Information Retrieval, SIGIR '13, Dublin, Ireland - July 28 - August 01, 2013},
editor = {Gareth J. F. Jones and Paraic Sheridan and Diane Kelly and Maarten de Rijke and Tetsuya Sakai},
publisher = {ACM},
isbn = {978-1-4503-2034-4},
}