Pascal Urien. Proving IoT Devices Firmware Integrity With Bijective MAC Time Stamped. In 6th IEEE World Forum on Internet of Things, WF-IoT 2020, New Orleans, LA, USA, June 2-16, 2020. pages 1-2, IEEE, 2020. [doi]
@inproceedings{Urien20-1, title = {Proving IoT Devices Firmware Integrity With Bijective MAC Time Stamped}, author = {Pascal Urien}, year = {2020}, doi = {10.1109/WF-IoT48130.2020.9221395}, url = {https://doi.org/10.1109/WF-IoT48130.2020.9221395}, researchr = {https://researchr.org/publication/Urien20-1}, cites = {0}, citedby = {0}, pages = {1-2}, booktitle = {6th IEEE World Forum on Internet of Things, WF-IoT 2020, New Orleans, LA, USA, June 2-16, 2020}, publisher = {IEEE}, isbn = {978-1-7281-5503-6}, }