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Effects of uni-axial mechanical stress on IGBT characteristics

Masanori Usui, Masayasu Ishiko, Koji Hotta, Satoshi Kuwano, Masato Hashimoto. Effects of uni-axial mechanical stress on IGBT characteristics. Microelectronics Reliability, 45(9-11):1682-1687, 2005. [doi]

Authors

Masanori Usui

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Masayasu Ishiko

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Koji Hotta

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Satoshi Kuwano

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Masato Hashimoto

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