Novel machine learning-based prediction approach for nanoindentation load-deformation in a thin film: Applications to electronic industries

Sujal Laxmikant Vajire, Abhishek Prashant Singh, Dinesh Kumar Saini, Anoop Kumar Mukhopadhyay, Kulwant Singh, Dhaneshwar Mishra. Novel machine learning-based prediction approach for nanoindentation load-deformation in a thin film: Applications to electronic industries. Computers & Industrial Engineering, 174:108824, 2022. [doi]

@article{VajireSSMSM22,
  title = {Novel machine learning-based prediction approach for nanoindentation load-deformation in a thin film: Applications to electronic industries},
  author = {Sujal Laxmikant Vajire and Abhishek Prashant Singh and Dinesh Kumar Saini and Anoop Kumar Mukhopadhyay and Kulwant Singh and Dhaneshwar Mishra},
  year = {2022},
  doi = {10.1016/j.cie.2022.108824},
  url = {https://doi.org/10.1016/j.cie.2022.108824},
  researchr = {https://researchr.org/publication/VajireSSMSM22},
  cites = {0},
  citedby = {0},
  journal = {Computers & Industrial Engineering},
  volume = {174},
  pages = {108824},
}