L. Valenti, Marcello Dalpasso, Michele Favalli. Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits. IET Computers & Digital Techniques, 8(2):83-89, 2014. [doi]
@article{ValentiDF14,
title = {Efficient testing of multi-output combinational cells in nano-complementary metal oxide semiconductor integrated circuits},
author = {L. Valenti and Marcello Dalpasso and Michele Favalli},
year = {2014},
doi = {10.1049/iet-cdt.2013.0077},
url = {http://dx.doi.org/10.1049/iet-cdt.2013.0077},
researchr = {https://researchr.org/publication/ValentiDF14},
cites = {0},
citedby = {0},
journal = {IET Computers & Digital Techniques},
volume = {8},
number = {2},
pages = {83-89},
}