Ricky Valentin, Donald Barker, Michael D. Osterman. Model for life prediction of fatigue-creep interaction. Microelectronics Reliability, 48(11-12):1831-1836, 2008. [doi]
@article{ValentinBO08, title = {Model for life prediction of fatigue-creep interaction}, author = {Ricky Valentin and Donald Barker and Michael D. Osterman}, year = {2008}, doi = {10.1016/j.microrel.2008.05.005}, url = {http://dx.doi.org/10.1016/j.microrel.2008.05.005}, researchr = {https://researchr.org/publication/ValentinBO08}, cites = {0}, citedby = {0}, journal = {Microelectronics Reliability}, volume = {48}, number = {11-12}, pages = {1831-1836}, }