A Global Sensitivity Analysis of Three- and Four-Layer EEG Conductivity Models

Sylvain Vallaghé, Maureen Clerc. A Global Sensitivity Analysis of Three- and Four-Layer EEG Conductivity Models. IEEE Trans. Biomed. Engineering, 56(4):988-995, 2009. [doi]

Authors

Sylvain Vallaghé

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Maureen Clerc

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