Optimal Test Sequences for Logic Verification closure in State Dependent RTL Digital designs - researchr publication authors

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Anantharaj Thalaimalai Vanaraj, Raja Sekar Kumaresan, Marshal Raj, G. Lakshminarayanan. Optimal Test Sequences for Logic Verification closure in State Dependent RTL Digital designs. In 13th International Conference on Computing Communication and Networking Technologies, ICCCNT 2022, Kharagpur, India, October 3-5, 2022. pages 1-6, IEEE, 2022. [doi]

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