Béla Vancsics, Tamás Gergely, Árpád Beszédes. Simulating the Effect of Test Flakiness on Fault Localization Effectiveness. In IEEE Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020. pages 28-35, IEEE, 2020. [doi]
@inproceedings{VancsicsGB20,
title = {Simulating the Effect of Test Flakiness on Fault Localization Effectiveness},
author = {Béla Vancsics and Tamás Gergely and Árpád Beszédes},
year = {2020},
doi = {10.1109/VST50071.2020.9051636},
url = {https://doi.org/10.1109/VST50071.2020.9051636},
researchr = {https://researchr.org/publication/VancsicsGB20},
cites = {0},
citedby = {0},
pages = {28-35},
booktitle = {IEEE Workshop on Validation, Analysis and Evolution of Software Tests, VST@SANER 2020, London, ON, Canada, February 18, 2020},
publisher = {IEEE},
isbn = {978-1-7281-6271-3},
}