Patrick Vandewalle, Chris Varekamp. Disparity map quality for image-based rendering based on multiple metrics. In 2014 International Conference on 3D Imaging, IC3D 2014, Liège, Belgium, December 9-10, 2014. pages 1-5, IEEE, 2014. [doi]
@inproceedings{VandewalleV14,
title = {Disparity map quality for image-based rendering based on multiple metrics},
author = {Patrick Vandewalle and Chris Varekamp},
year = {2014},
doi = {10.1109/IC3D.2014.7032599},
url = {http://dx.doi.org/10.1109/IC3D.2014.7032599},
researchr = {https://researchr.org/publication/VandewalleV14},
cites = {0},
citedby = {0},
pages = {1-5},
booktitle = {2014 International Conference on 3D Imaging, IC3D 2014, Liège, Belgium, December 9-10, 2014},
publisher = {IEEE},
isbn = {978-1-4799-8023-9},
}