On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions

Valery A. Vardanian. On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions. In 12th IEEE VLSI Test Symposium (VTS'94), April 25-28, 1994, Cherry Hill, New Jersey, USA. pages 182-185, IEEE Computer Society, 1994. [doi]

@inproceedings{Vardanian94-0,
  title = {On the complexity of terminal stuck-at fault detection tests for monotone Boolean functions},
  author = {Valery A. Vardanian},
  year = {1994},
  doi = {10.1109/VTEST.1994.292316},
  url = {http://dx.doi.org/10.1109/VTEST.1994.292316},
  researchr = {https://researchr.org/publication/Vardanian94-0},
  cites = {0},
  citedby = {0},
  pages = {182-185},
  booktitle = {12th IEEE VLSI Test Symposium (VTS'94),  April 25-28, 1994, Cherry Hill, New Jersey, USA},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-5440-6},
}