J. Varghese, A. Dasgupta. An experimental approach to characterize rate-dependent failure envelopes and failure site transitions in surface mount assemblies. Microelectronics Reliability, 47(7):1095-1102, 2007. [doi]
@article{VargheseD07a,
title = {An experimental approach to characterize rate-dependent failure envelopes and failure site transitions in surface mount assemblies},
author = {J. Varghese and A. Dasgupta},
year = {2007},
doi = {10.1016/j.microrel.2006.07.002},
url = {http://dx.doi.org/10.1016/j.microrel.2006.07.002},
tags = {systematic-approach},
researchr = {https://researchr.org/publication/VargheseD07a},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {7},
pages = {1095-1102},
}