V. A. Vashchenko, A. Concannon, M. ter Beek, P. Hopper. LVTSCR structures for latch-up free ESD protection of BiCMOS RF circuits. Microelectronics Reliability, 43(1):61-69, 2003. [doi]
@article{VashchenkoCBH03,
title = {LVTSCR structures for latch-up free ESD protection of BiCMOS RF circuits},
author = {V. A. Vashchenko and A. Concannon and M. ter Beek and P. Hopper},
year = {2003},
doi = {10.1016/S0026-2714(02)00125-7},
url = {http://dx.doi.org/10.1016/S0026-2714(02)00125-7},
researchr = {https://researchr.org/publication/VashchenkoCBH03},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {43},
number = {1},
pages = {61-69},
}