Kees Veelenturf. The Road to Better Reliability and Yield Embedded DfM Tools. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 67, IEEE Computer Society, 2000. [doi]
@inproceedings{Veelenturf00, title = {The Road to Better Reliability and Yield Embedded DfM Tools}, author = {Kees Veelenturf}, year = {2000}, url = {http://csdl.computer.org/comp/proceedings/date/2000/0537/00/05370067abs.htm}, tags = {reliability}, researchr = {https://researchr.org/publication/Veelenturf00}, cites = {0}, citedby = {0}, pages = {67}, booktitle = {2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France}, publisher = {IEEE Computer Society}, isbn = {0-7695-0537-6}, }