Sriharsha Veeramachaneni, Paolo Avesani. Active Sampling for Feature Selection. In Proceedings of the 3rd IEEE International Conference on Data Mining (ICDM 2003), 19-22 December 2003, Melbourne, Florida, USA. pages 665-668, IEEE Computer Society, 2003. [doi]
@inproceedings{VeeramachaneniA03,
title = {Active Sampling for Feature Selection},
author = {Sriharsha Veeramachaneni and Paolo Avesani},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/icdm/2003/1978/00/19780665abs.htm},
researchr = {https://researchr.org/publication/VeeramachaneniA03},
cites = {0},
citedby = {0},
pages = {665-668},
booktitle = {Proceedings of the 3rd IEEE International Conference on Data Mining (ICDM 2003), 19-22 December 2003, Melbourne, Florida, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1978-4},
}