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Sriharsha Veeramachaneni, Emanuele Olivetti, Paolo Avesani. Active sampling for detecting irrelevant features. In William W. Cohen, Andrew Moore, editors, Machine Learning, Proceedings of the Twenty-Third International Conference (ICML 2006), Pittsburgh, Pennsylvania, USA, June 25-29, 2006. Volume 148 of ACM International Conference Proceeding Series, pages 961-968, ACM, 2006. [doi]

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