A Current Reference with high Robustness to Process and Supply Voltage Variations unaffected by Body Effect upon Threshold Voltage - researchr publication authors

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Dominik Veit, Jürgen Oehm. A Current Reference with high Robustness to Process and Supply Voltage Variations unaffected by Body Effect upon Threshold Voltage. In 18th IEEE International New Circuits and Systems Conference, NEWCAS 2020, Montréal, QC, Canada, June 16-19, 2020. pages 34-37, IEEE, 2020. [doi]

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