Jaime Velasco-Medina, Iyad Rayane, Michael Nicolaidis. On-Line BIST for Testing Analog Circuits. In ICCD. pages 330, 1999. [doi]
@inproceedings{Velasco-MedinaRN99,
title = {On-Line BIST for Testing Analog Circuits},
author = {Jaime Velasco-Medina and Iyad Rayane and Michael Nicolaidis},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/iccd/1999/0406/00/04060330abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/Velasco-MedinaRN99},
cites = {0},
citedby = {0},
pages = {330},
booktitle = {ICCD},
}