A review of process fault detection and diagnosis: Part III: Process history based methods

Venkat Venkatasubramanian, Raghunathan Rengaswamy, Surya N. Kavuri, Kewen Yin. A review of process fault detection and diagnosis: Part III: Process history based methods. Computers & Chemical Engineering, 27(3):327-346, 2003. [doi]

Authors

Venkat Venkatasubramanian

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Raghunathan Rengaswamy

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Surya N. Kavuri

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Kewen Yin

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