On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking

Jouke Verbree, Erik Jan Marinissen, Philippe Roussel, Dimitrios Velenis. On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 36-41, IEEE Computer Society, 2010. [doi]

@inproceedings{VerbreeMRV10,
  title = {On the cost-effectiveness of matching repositories of pre-tested wafers for wafer-to-wafer 3D chip stacking},
  author = {Jouke Verbree and Erik Jan Marinissen and Philippe Roussel and Dimitrios Velenis},
  year = {2010},
  doi = {10.1109/ETSYM.2010.5512785},
  url = {http://dx.doi.org/10.1109/ETSYM.2010.5512785},
  tags = {testing},
  researchr = {https://researchr.org/publication/VerbreeMRV10},
  cites = {0},
  citedby = {0},
  pages = {36-41},
  booktitle = {15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic},
  publisher = {IEEE Computer Society},
  isbn = {978-1-4244-5833-2},
}