A fully integrated switch capacitor step down DC-DC converter in 65nm bulk CMOS technology with peak efficiency tracking

Carlo Veri, Mirko Pasca, Giuseppe Tau, Stefano D'Amico. A fully integrated switch capacitor step down DC-DC converter in 65nm bulk CMOS technology with peak efficiency tracking. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 189-192, IEEE, 2016. [doi]

@inproceedings{VeriPTD16,
  title = {A fully integrated switch capacitor step down DC-DC converter in 65nm bulk CMOS technology with peak efficiency tracking},
  author = {Carlo Veri and Mirko Pasca and Giuseppe Tau and Stefano D'Amico},
  year = {2016},
  doi = {10.1109/ICECS.2016.7841164},
  url = {http://dx.doi.org/10.1109/ICECS.2016.7841164},
  researchr = {https://researchr.org/publication/VeriPTD16},
  cites = {0},
  citedby = {0},
  pages = {189-192},
  booktitle = {2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016},
  publisher = {IEEE},
  isbn = {978-1-5090-6113-6},
}