Carlo Veri, Mirko Pasca, Giuseppe Tau, Stefano D'Amico. A fully integrated switch capacitor step down DC-DC converter in 65nm bulk CMOS technology with peak efficiency tracking. In 2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016. pages 189-192, IEEE, 2016. [doi]
@inproceedings{VeriPTD16, title = {A fully integrated switch capacitor step down DC-DC converter in 65nm bulk CMOS technology with peak efficiency tracking}, author = {Carlo Veri and Mirko Pasca and Giuseppe Tau and Stefano D'Amico}, year = {2016}, doi = {10.1109/ICECS.2016.7841164}, url = {http://dx.doi.org/10.1109/ICECS.2016.7841164}, researchr = {https://researchr.org/publication/VeriPTD16}, cites = {0}, citedby = {0}, pages = {189-192}, booktitle = {2016 IEEE International Conference on Electronics, Circuits and Systems, ICECS 2016, Monte Carlo, Monaco, December 11-14, 2016}, publisher = {IEEE}, isbn = {978-1-5090-6113-6}, }