Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components

Wolfgang Vermeiren, Bernd Straube, Andreas Holubek. Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components. In 1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996. pages 522-527, IEEE Computer Society, 1996. [doi]

@inproceedings{VermeirenSH96,
  title = {Defect-Oriented Experiments in Fault Modelling and Fault Simulation of Microsystem Components},
  author = {Wolfgang Vermeiren and Bernd Straube and Andreas Holubek},
  year = {1996},
  doi = {10.1109/EDTC.1996.494350},
  url = {http://doi.ieeecomputersociety.org/10.1109/EDTC.1996.494350},
  researchr = {https://researchr.org/publication/VermeirenSH96},
  cites = {0},
  citedby = {0},
  pages = {522-527},
  booktitle = {1996 European Design and Test Conference, ED&TC 1996, Paris, France, March 11-14, 1996},
  publisher = {IEEE Computer Society},
  isbn = {0-8186-7423-7},
}