Kushal Virupakshappa, Erdal Oruklu. Investigation of Feature Inputs for Binary Classification of Ultrasonic NDT Signals using SVM and Neural Networks. In Hoi Lee, Randall L. Geiger, editors, 62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019. pages 638-641, IEEE, 2019. [doi]
@inproceedings{VirupakshappaO19,
title = {Investigation of Feature Inputs for Binary Classification of Ultrasonic NDT Signals using SVM and Neural Networks},
author = {Kushal Virupakshappa and Erdal Oruklu},
year = {2019},
doi = {10.1109/MWSCAS.2019.8884852},
url = {https://doi.org/10.1109/MWSCAS.2019.8884852},
researchr = {https://researchr.org/publication/VirupakshappaO19},
cites = {0},
citedby = {0},
pages = {638-641},
booktitle = {62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019},
editor = {Hoi Lee and Randall L. Geiger},
publisher = {IEEE},
isbn = {978-1-7281-2788-0},
}