John K. Visich, John T. Powers, Christopher J. Roethlein. Empirical applications of RFID in the manufacturing environment. IJRFITA, 2(3/4):115-132, 2009. [doi]
@article{VisichPR09,
title = {Empirical applications of RFID in the manufacturing environment},
author = {John K. Visich and John T. Powers and Christopher J. Roethlein},
year = {2009},
doi = {10.1504/IJRFITA.2009.025148},
url = {http://dx.doi.org/10.1504/IJRFITA.2009.025148},
tags = {empirical, meta-model, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/VisichPR09},
cites = {0},
citedby = {0},
journal = {IJRFITA},
volume = {2},
number = {3/4},
pages = {115-132},
}