Jeffrey M. Voas, Keith W. Miller, Jeffery E. Payne. A software analysis technique for quantifying reliability in high-risk medical devices. In Sixth Annual IEEE Symposium on Computer-Based Medical Systems (CBMS'93), June 13-16, 1993, Ann Arbor, MI, USA. pages 64-69, IEEE Computer Society, 1993. [doi]
@inproceedings{VoasMP93,
title = {A software analysis technique for quantifying reliability in high-risk medical devices},
author = {Jeffrey M. Voas and Keith W. Miller and Jeffery E. Payne},
year = {1993},
doi = {10.1109/CBMS.1993.262989},
url = {http://dx.doi.org/10.1109/CBMS.1993.262989},
researchr = {https://researchr.org/publication/VoasMP93},
cites = {0},
citedby = {0},
pages = {64-69},
booktitle = {Sixth Annual IEEE Symposium on Computer-Based Medical Systems (CBMS'93), June 13-16, 1993, Ann Arbor, MI, USA},
publisher = {IEEE Computer Society},
isbn = {0-8186-3752-8},
}