Nonlinear Filtering of Electron Micrographs by Means of Support Vector Regression

Roland Vollgraf, Michael Scholz, Ian A. Meinertzhagen, Klaus Obermayer. Nonlinear Filtering of Electron Micrographs by Means of Support Vector Regression. In Sebastian Thrun, Lawrence K. Saul, Bernhard Schölkopf, editors, Advances in Neural Information Processing Systems 16 [Neural Information Processing Systems, NIPS 2003, December 8-13, 2003, Vancouver and Whistler, British Columbia, Canada]. pages 717-724, MIT Press, 2003. [doi]

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