Hans de Vries, Kunigunde Cherenack. Endurance behavior of conductive yarns. Microelectronics Reliability, 54(1):327-330, 2014. [doi]
@article{VriesC14,
title = {Endurance behavior of conductive yarns},
author = {Hans de Vries and Kunigunde Cherenack},
year = {2014},
doi = {10.1016/j.microrel.2013.08.014},
url = {http://dx.doi.org/10.1016/j.microrel.2013.08.014},
researchr = {https://researchr.org/publication/VriesC14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {1},
pages = {327-330},
}