Geometrical calibration and aperture configuration design in multi-pinhole SPECT

Kathleen Vunckx, Michel Defrise, Dirk Beque, Christian Vanhove, Andriy Andreyev, Johan Nuyts. Geometrical calibration and aperture configuration design in multi-pinhole SPECT. In Proceedings of the 2008 IEEE International Symposium on Biomedical Imaging: From Nano to Macro, Paris, France, May 14-17, 2008. pages 1403-1406, IEEE, 2008. [doi]

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