V. Vuorinen, A. Rautiainen, H. Heikkinen, Mervi Paulasto-Kröckel. Optimization of contact metallizations for reliable wafer level AuSn bonds. Microelectronics Reliability, 64:676-680, 2016. [doi]
@article{VuorinenRHP16,
title = {Optimization of contact metallizations for reliable wafer level AuSn bonds},
author = {V. Vuorinen and A. Rautiainen and H. Heikkinen and Mervi Paulasto-Kröckel},
year = {2016},
doi = {10.1016/j.microrel.2016.07.013},
url = {http://dx.doi.org/10.1016/j.microrel.2016.07.013},
researchr = {https://researchr.org/publication/VuorinenRHP16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {64},
pages = {676-680},
}