Ross F. Walker, Paul T. Jackway. Statistical geometric features-extensions for cytological texture analysis. In 13th International Conference on Pattern Recognition, ICPR 1996, Vienna, Austria, 25-19 August, 1996. pages 790-794, IEEE, 1996. [doi]
@inproceedings{WalkerJ96,
title = {Statistical geometric features-extensions for cytological texture analysis},
author = {Ross F. Walker and Paul T. Jackway},
year = {1996},
doi = {10.1109/ICPR.1996.546931},
url = {http://doi.ieeecomputersociety.org/10.1109/ICPR.1996.546931},
researchr = {https://researchr.org/publication/WalkerJ96},
cites = {0},
citedby = {0},
pages = {790-794},
booktitle = {13th International Conference on Pattern Recognition, ICPR 1996, Vienna, Austria, 25-19 August, 1996},
publisher = {IEEE},
}