Jeremy A. Walraven. Future Challenges for MEMS Failure Analysis. In Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA. pages 850-855, IEEE Computer Society, 2003. [doi]
@inproceedings{Walraven03c, title = {Future Challenges for MEMS Failure Analysis}, author = {Jeremy A. Walraven}, year = {2003}, url = {http://csdl.computer.org/comp/proceedings/itc/2003/2063/00/20630850abs.htm}, tags = {analysis}, researchr = {https://researchr.org/publication/Walraven03c}, cites = {0}, citedby = {0}, pages = {850-855}, booktitle = {Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, USA}, publisher = {IEEE Computer Society}, isbn = {0-7803-8106-8}, }